STANDARD Missile Built-in-Test (BIT)
BIT and Fault Isolation Test (FIT) are the methods of incorporating into a product the means and intelligence to allow the product to test and evaluate itself and return results to the user.
WILLCOR has the personnel with the background in both BIT and FIT to perform system design and oversight in the development of self-contained non-destructive testing in electronic, mechanical, and chemical systems. WILLCOR experience extends to guidance and evaluation of software as well as hardware development and system of systems design implementation. This comes from years of experienced application to airborne and submarine equipment and is represented in the BIT development within the Standard Missile family where WILLCOR is directing studies and incorporation of extended BIT and FIT to perform test of missiles on a periodic basis and prior to launch, as well as in flight. This BIT/FIT approach improves availability, reliability, and improved ILS while reducing cost of the missile programs and allowing update of missile software.
WILLCOR is assisting the Aegis BMD office in directing the efforts of Raytheon and Lockheed Martin in the performance of studies and plans for implementation of BIT in the STANDARD Missile (SM-3) program with additional efforts to back-fit this capability within all of the STANDARD Missile program.